Lock Offers Space Saving Waferthin With 40% Improved Sensitivity

Lock Inspection Systems now offers its MET30+ Waferthin HF metal detector in a high frequency model that improves sensitivity by up to 40%. The Met30+ Waferthin has a compact design to fit tight parameters, while still retaining high quality control standards and offers even greater sensitivity with the availability of high frequency. It is capable of detecting miniscule slivers of stainless steel while maintaining the super slim detector case design which allows the Waferthin to be installed in tight bagger/scale spaces.

The Waferthin HF features user-friendly and easily accessible operator controls. Also available with the MET30+ waferthin metal detector is Lock's exclusive ADC software system. ADC provides operational and maintenance staff with an onscreen diagnostic tool which features a unique graphic technology that acts as a "window to the detection envelope" to help identify and resolve problem areas and simplify data analysis of metal contamination and product signal. This software can be operated from a laptop or via the metal detector touchscreen panel option.

SOURCE: Lock Inspection Systems