Product/Service

Powder Diffractometry

Source: PANalytical BV
Powder Diffractometry - The implementation of the latest RTMS (Real Time Multiple Strip) X-ray detection technology into a compact, yet powerful PreFIX module has changed the world of powder diffractometry. The use of RTMS detection technology ensures that the X'Celerator can handle high count rates, without saturating the device.

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Brochure: X-Ray Solutions For The Pharmaceutical Industry
Corporate Brochure: PANalytical: At The Core Of The Matter

Powder Diffractometry - The implementation of the latest RTMS (Real Time Multiple Strip) X-ray detection technology into a compact, yet powerful PreFIX module has changed the world of powder diffractometry.

Unique Benefits
Unique benefits of the award-winning X'Celerator include:

  • Ultrafast data collection through RTMS (Real Time Multiple Strip) detection technology: a high quality powder diffractogram is obtained in only a few minutes of time.
  • No-compromise resolution for powders and other polycrystalline materials: the large reduction in data collection time can of course also be used to increase the resolution of the diffractogram.
  • Compact PreFIX module: the X'Celerator follows the same philosophy as all our other PreFIX modules. It is easily exchanged for another optical module - without alignment.
  • Maintenance-free detection system: the detector is really 'plug and play': the X'Celerator does not need cooling water, a flow of liquid nitrogen, counting gas, or time-consuming positional or intensity calibrations.
Several additional items are available for fine-tuning of the X'Celerator for different applications, such as Beta-filters, Soller slits of various sizes as well as a diffracted beam monochromator.

Application Areas
The use of RTMS detection technology ensures that the X'Celerator can handle high count rates, without saturating the device. Typical application areas of the X'Celerator include:

  • Fast identification of mixtures of unknown phases. The usage together with automatic identification software allows for a complete analysis of an unknown sample in only 15 minutes, which includes the preparation of the sample, the actual measurement, the identification and the generation of a report.
  • Standardless quantification of mixtures of phases, using for instance the Rietveld method. The collection of a diffractogram with a quality good enough for subsequent quantification can be done in one or two minutes.
  • Refinement of crystal structures. Data can be collected in a fraction of the time originally needed, or the gain in time can be used to improve the resolution in the diffractogram, for instance by application of narrower Soller slits and/or a focusing incident beam (Johansson) monochromator.
  • Phase transitions at non-ambient conditions. With the X'Celerator, the time needed for recording series of diffractograms at different temperatures, pressures or humidity levels is significantly reduced.
  • In-situ observations of rapid phase transitions.
  • Residual stress measurements.
  • Measurement of samples in glass capillaries (Debye-Scherrer geometry).
  • Micro-diffraction.

Click Here To Download:
Brochure: X-Ray Solutions For The Pharmaceutical Industry
Corporate Brochure: PANalytical: At The Core Of The Matter