X'Pert HighScore Plus — X-ray Powder Pattern Analysis

X'Pert HighScore Plus is a complete full powder pattern analysis tool. It unites phase identification, crystallographic analysis, cluster analysis, and Rietveld calculations in one software package covering all common powder diffraction applications.

Powerful new generation search-match-identification
The search-match algorithm in X'Pert HighScore Plus combines peak and net profile data in a single search step, which usually produces the most reliable results. On demand you can use peak or profile data individually or instantly re-score the existing candidates list based on whatever input you prefer.

Comprehensive crystallographic analysis
X'Pert HighScore Plus contains three classical indexing routines plus the McMaille random-search/grid-search routine. The unit cell refinement and a space group test on either the full profile (Le Bail fit) or on indexed peaks complete the analysis.

Rietveld refinements
Rietveld analysis of powder or neutron data is easy with X'Pert HighScore Plus. Automatic strategies and batches support the novice user. The refinement control displays a complete picture of all parameters, limits and constraints involved. Six different profile functions fit to all optics of common diffraction instruments.

High volume data analysis
Cluster analysis greatly simplifies the analysis of large amounts of data. It automatically sorts all closely related scans of an experiment into clusters and marks the most representative scan of each cluster, as well as outlying patterns.

Cluster analysis is useful for non-ambient experiments, mining samples and soil mapping, for synthesis experiments such as zeolites, and for finding polymorphs and solvates in drug development. X'Pert HighScore can process up to 50 scans simultaneously per cluster analysis.